Jeol Arm200f Manual. First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio. Jeol ARM200F The Jeol ARM200F. The Jeol ARM 200F is a world-class high-resolution (scanning) transmission electron microscope (S)TEM. JEOL JEM 2010 TRAINING TRANSMISSION ELECTRON MICROSCOPE USER MANUAL Version 5.1 EM Facility CMSE-SEF Massachusetts Institution of. ARM200F is the new state-of-the art probe-lens aberration corrected. JEOL as well as by the 9 promoters of. Location: Holder building room 154.00.10 Telephone: N/A Contact: Neil Young The 2100 microscope operates a LaB 6. JEOL ARM200F - Image Corrected. Jeol Arm200f Manual Arts Service. Omschrijving van de TEM ARM200F. ARM200F is the new state-of-the art probe-lens aberration corrected. Jem Arm200f Working Instructions Free PDF eBook Download: Jem Arm200f Working Instructions Download or Read Online eBook jem arm200f working instructions in PDF. This is an absolute necessity for the instrument to perform at ultra- high resolution. The JEOL JEM-ARM200F double Cs-corrected Transmission Electron Microscope (TEM) is an Atomic Resolution Microscope (ARM) with a field emission cathode and integrated correction of the spherical aberrations (Cs) of the objective and condenser lenses.
The Jeol ARM 200F is a world-class high-resolution (scanning) transmission electron microscope (S)TEM. The Warwick ARM 200F is aberration-corrected both in probe-forming optics (probe size FWHM <80 picometres) and in image-forming optics (image resolution <80 picometres). This allows atomic resolution imaging both in STEM and TEM modes, as shown in the examples (right).
The microscope has a Gatan Quantum electron energy loss spectrometer (EELS) to allow detection and quantification of the elemental composition down to the atomic level. Dual EELS allows both low-loss and core-loss regions of the spectrum to be collected simultaneously and a fast shutter allows data rates of up to 1000 spectra/second.
The microscope also currently has a 100mm2 Oxford Instruments windowless energy-dispersive X-ray (EDX) detector. This also yields composition maps with atomic resolution; both EDX and EELS spectra can be collected simultaneously at high data rates.
Specifications and Capabilities
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Schottky field emission gun (FEG)
Operation at 80 and 200 kV
Double aberration correction (STEM and TEM)
Electron energy loss spectroscopy (EELS)
Energy dispersive X-ray spectroscopy (EDX)
STEM resolution <80 pm with BF, ADF, HAADF detectors
Atomic resolution imaging and elemental analysis.
STEM images 200x to 150,000,000x
TEM images 50x to 2,000,000 x
Specimen size 3 mm diameter
Gatan Orius SC1000 CCD camera
UK-based reseachers outside Warwick can access our aberration-corrected TEM and STEM through an application to SuperSTEM
Example images
Atomic resolution STEM image of MoSe2–WSe2 lateral monolayer semiconductor heterojunctions.1
Atomic resolution TEM image using exit wave reconstruction (EWR) of graphene with overlaid ball and stick model.2
Relevant Publications
1 C. Huang et al.Nature Materials, 2014, 13, 1096
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2 R.J. Kashtiban et al.Nature Comms, 2014, 5, 4902